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国外电子测量技术
国外电子测量技术
Foreign Electronic Measurement Technology 국외전자측량기술
CSTPCD(2023)
北大核心(2020)
获奖情况：
CNKI中国期刊全文数据库收录期刊,中国学术期刊综合评价数据库来源期刊
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北京方略信息科技有限公司
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陈光衤禹
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月刊
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国际刊号：
1002-8978
国内刊号：
11-2268/TN
影响因子：
1.62
文献量：
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被引量：
44481
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[{"name":"研究与开发","count":1405,"id":1},{"name":"理论与方法","count":1393,"id":2},{"name":"应用天地","count":1335,"id":3},{"name":"Application","count":1276,"id":4},{"name":"Theory & Method","count":1263,"id":5},{"name":"R & D","count":629,"id":6},{"name":"Research & Development","count":619,"id":7},{"name":"消息","count":208,"id":8},{"name":"R&D","count":179,"id":9},{"name":"业界动态","count":158,"id":10},{"name":"研究与设计","count":143,"id":11},{"name":"专题策划","count":135,"id":12},{"name":"Theory&Method","count":109,"id":13},{"name":"前沿技术","count":101,"id":14},{"name":"热点报道","count":96,"id":15},{"name":"设计与应用","count":87,"id":16},{"name":"信息","count":62,"id":17},{"name":"产品介绍","count":57,"id":18},{"name":"综述","count":44,"id":19},{"name":"Research&Development","count":42,"id":20},{"name":"『研究与开发』","count":40,"id":21},{"name":"测量与测试","count":39,"id":22},{"name":"测量与分析","count":38,"id":23},{"name":"『业界动态』","count":36,"id":24},{"name":"实践心得","count":36,"id":25},{"name":"『应用天地』","count":32,"id":26},{"name":"虚拟仪器","count":31,"id":27},{"name":"Artificial Intelligence","count":30,"id":28},{"name":"Learned in practice","count":30,"id":29},{"name":"『理论与方法』","count":30,"id":30},{"name":"新品之窗","count":27,"id":31},{"name":"「人工智能」专题","count":26,"id":32},{"name":"设计技术","count":23,"id":33},{"name":"Special Topics","count":22,"id":34},{"name":"应用技术","count":22,"id":35},{"name":"企业巡礼","count":21,"id":36},{"name":"仪器与应用","count":19,"id":37},{"name":"数据采集","count":19,"id":38},{"name":"电子仪器","count":19,"id":39},{"name":"专家论坛","count":17,"id":40},{"name":"世界动态","count":17,"id":41},{"name":"Hot Topic","count":15,"id":42},{"name":"研究与方法","count":15,"id":43},{"name":"软件技术","count":15,"id":44},{"name":"R＆D","count":14,"id":45},{"name":"Expert Forum","count":13,"id":46},{"name":"Survey","count":12,"id":47},{"name":"供您阅读","count":12,"id":48},{"name":"Report from abroad","count":11,"id":49},{"name":"名家讲坛","count":11,"id":50},{"name":"域外传真","count":11,"id":51},{"name":"应用指南","count":10,"id":52},{"name":"征文与征订","count":10,"id":53},{"name":"调查园地","count":10,"id":54},{"name":"Front Technology","count":9,"id":55},{"name":"Rescarch&Development","count":9,"id":56},{"name":"『热点报道』","count":9,"id":57},{"name":"Cutting-edge Technology","count":8,"id":58},{"name":"Enterprises panorama","count":8,"id":59},{"name":"『前沿技术』","count":8,"id":60},{"name":"Summary","count":7,"id":61},{"name":"仪器与系统","count":7,"id":62},{"name":"仪表与系统","count":7,"id":63},{"name":"企业访谈","count":7,"id":64},{"name":"接口与总线","count":7,"id":65},{"name":"Theorv & Method","count":6,"id":66},{"name":"Theory ＆ Method","count":6,"id":67},{"name":"『专题策划』","count":6,"id":68},{"name":"『理论与办法』","count":6,"id":69},{"name":"实用技术","count":6,"id":70},{"name":"总线应用","count":6,"id":71},{"name":"总线技术","count":6,"id":72},{"name":"新产品","count":6,"id":73},{"name":"检测与诊断","count":6,"id":74},{"name":"理沦与办法","count":6,"id":75},{"name":"ApplCation","count":5,"id":76},{"name":"Cutting-Edge Technology","count":5,"id":77},{"name":"Cutting-edge technology","count":5,"id":78},{"name":"Food Safety Detection","count":5,"id":79},{"name":"Hot topic","count":5,"id":80},{"name":"Investigation","count":5,"id":81},{"name":"NI电子测量应用案例连载","count":5,"id":82},{"name":"多国仪器展专栏","count":5,"id":83},{"name":"总线与系统","count":5,"id":84},{"name":"总线与网络","count":5,"id":85},{"name":"网络与总线","count":5,"id":86},{"name":"虚似仪器","count":5,"id":87},{"name":"食品安全检测","count":5,"id":88},{"name":"专题连载--示波器(三)","count":4,"id":89},{"name":"产品展示","count":4,"id":90},{"name":"人工智能","count":4,"id":91},{"name":"仪器与仪表","count":4,"id":92},{"name":"仿真技术","count":4,"id":93},{"name":"力科电子测量应用案例连载","count":4,"id":94},{"name":"工程师之声","count":4,"id":95},{"name":"报点报道","count":4,"id":96},{"name":"故障诊断","count":4,"id":97},{"name":"测试技术","count":4,"id":98},{"name":"电磁兼容","count":4,"id":99},{"name":"竞赛之光","count":4,"id":100},{"name":"网上资料浏览","count":4,"id":101},{"name":"网上资源","count":4,"id":102},{"name":"软件应用","count":4,"id":103},{"name":"ATE","count":3,"id":104},{"name":"Award-winning paper","count":3,"id":105},{"name":"Competitions","count":3,"id":106},{"name":"Enterprise panorama","count":3,"id":107},{"name":"Guide","count":3,"id":108},{"name":"LeCroy Test & Measurement Solutions Serial","count":3,"id":109},{"name":"Metrology","count":3,"id":110},{"name":"Products show","count":3,"id":111},{"name":"Special Topic Series","count":3,"id":112},{"name":"仪器应用","count":3,"id":113},{"name":"检定与校准","count":3,"id":114},{"name":"热门话题","count":3,"id":115},{"name":"获奖论文","count":3,"id":116},{"name":"蓝牙技术","count":3,"id":117},{"name":"计量检定","count":3,"id":118},{"name":"非电量测量","count":3,"id":119},{"name":"Agilent Test & Measurement Solutions Serial","count":2,"id":120},{"name":"EMC","count":2,"id":121},{"name":"Enterprises Panorama","count":2,"id":122},{"name":"Interview","count":2,"id":123},{"name":"Learned in Practice","count":2,"id":124},{"name":"Special Topic","count":2,"id":125},{"name":"Technology Investigation","count":2,"id":126},{"name":"Voice of the Engineer","count":2,"id":127},{"name":"专题--串行测试","count":2,"id":128},{"name":"专题--通信测试","count":2,"id":129},{"name":"专题--高速串行测试","count":2,"id":130},{"name":"专题连载--示波器(二)","count":2,"id":131},{"name":"专题连载——法波器(一)","count":2,"id":132},{"name":"人物访谈","count":2,"id":133},{"name":"传感器技术","count":2,"id":134},{"name":"可靠性","count":2,"id":135},{"name":"名词解释","count":2,"id":136},{"name":"基础产品连载","count":2,"id":137},{"name":"安捷伦电子测量应用案例连载","count":2,"id":138},{"name":"技术探讨","count":2,"id":139},{"name":"探头技术","count":2,"id":140},{"name":"故障检测","count":2,"id":141},{"name":"泰克电子测量应用案例连载","count":2,"id":142},{"name":"泰科电子测量应用案例连载","count":2,"id":143},{"name":"测试系统","count":2,"id":144},{"name":"测量与控制","count":2,"id":145},{"name":"热点技术","count":2,"id":146},{"name":"理论和方法","count":2,"id":147},{"name":"电子设计","count":2,"id":148},{"name":"虚拟技术","count":2,"id":149},{"name":"计量与校准","count":2,"id":150},{"name":"Award-winnig paper","count":1,"id":151},{"name":"Culling-edge lechnology","count":1,"id":152},{"name":"EDA技术","count":1,"id":153},{"name":"Investgation","count":1,"id":154},{"name":"Learned in Panorama","count":1,"id":155},{"name":"NI Test & Measurement Solutions Serial","count":1,"id":156},{"name":"News","count":1,"id":157},{"name":"R&S电子测量应用案例","count":1,"id":158},{"name":"SMT技术","count":1,"id":159},{"name":"Special Report","count":1,"id":160},{"name":"Teaching Practice","count":1,"id":161},{"name":"Tektronix Test & Measurement Solutions Serial","count":1,"id":162},{"name":"『安捷伦电子测量应用案例连载』","count":1,"id":163},{"name":"『获奖论文』","count":1,"id":164},{"name":"专家论壇","count":1,"id":165},{"name":"专家访谈","count":1,"id":166},{"name":"专题报告","count":1,"id":167},{"name":"仪器仪表","count":1,"id":168},{"name":"企业仿谈","count":1,"id":169},{"name":"会议报道","count":1,"id":170},{"name":"传输技术","count":1,"id":171},{"name":"信号分析","count":1,"id":172},{"name":"信息处理","count":1,"id":173},{"name":"光纤测量","count":1,"id":174},{"name":"力科电子测量仪器的新进展","count":1,"id":175},{"name":"力科电子测量应用安全连载","count":1,"id":176},{"name":"可测性技术","count":1,"id":177},{"name":"可测性设计","count":1,"id":178},{"name":"可靠性技术","count":1,"id":179},{"name":"商业动态","count":1,"id":180},{"name":"器件应用","count":1,"id":181},{"name":"国外优选新品","count":1,"id":182},{"name":"国际动态","count":1,"id":183},{"name":"安捷伦电子测量应用案例","count":1,"id":184},{"name":"总目次","count":1,"id":185},{"name":"抗干扰技术","count":1,"id":186},{"name":"接口技术","count":1,"id":187},{"name":"接地技术","count":1,"id":188},{"name":"教学实践","count":1,"id":189},{"name":"新年寄语2015","count":1,"id":190},{"name":"无线技术","count":1,"id":191},{"name":"时间标准","count":1,"id":192},{"name":"标准技术","count":1,"id":193},{"name":"校准技术","count":1,"id":194},{"name":"校准方法","count":1,"id":195},{"name":"检测与测量","count":1,"id":196},{"name":"汽车电子","count":1,"id":197},{"name":"测试方法","count":1,"id":198},{"name":"测量标准","count":1,"id":199},{"name":"理论分析","count":1,"id":200}]
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